Spherulitic and rotational crystal growth of Quartz thin films

To obtain crystalline thin films of alpha-Quartz represents a challenge due to the tendency for material towards spherulitic growth. Thus, understanding mechanisms that give rise growth can help regulate process. Here type 2D crystal in amorphous Quartz was analyzed by electron back-scatter diffraction (EBSD). EBSD used measure size, orientation, and rotation crystallographic grains polycrystalline SiO2 GeO2 with high spatial resolution. Individual colonies contain primary secondary single fibers, which grow radially from colony center its edge, fill near circular area completely. During their growth, individual fibers form so-called rotational crystals, when some lattice planes are continuously bent. The directions axes were determined an enhanced analysis data. A possible mechanism, including generation particular dislocation(s), is suggested.